µ¼Ê¦ÐÕÃû£ºÖ£Ñ§¾ü
ÐÔ±ð£ºÄÐ
ÈËÆøÖ¸Êý£º232
ËùÊôԺУ£ºÏæÌ¶´óѧ
ËùÊôԺϵ£º»úе¹¤³ÌѧԺ
Ö°³Æ£º½ÌÊÚ
µ¼Ê¦ÀàÐÍ£º²©µ¼
ÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£º
Ñо¿ÁìÓò£º 1¡¢µÍάÄÉÃײÄÁϼ°ÆäÃô¸ÐÆ÷¼þ2¡¢°ëµ¼ÌåÄÉÃ׽ṹ¼°Î¢Äɹâ»úµçϵͳ3¡¢Ñ¹µç²ÄÁϼ°´«¸ÐÔªÆ÷¼þ4¡¢... [Õ¹¿ª]
Ñо¿ÁìÓò£º 1¡¢µÍάÄÉÃײÄÁϼ°ÆäÃô¸ÐÆ÷¼þ2¡¢°ëµ¼ÌåÄÉÃ׽ṹ¼°Î¢Äɹâ»úµçϵͳ3¡¢Ñ¹µç²ÄÁϼ°´«¸ÐÔªÆ÷¼þ4¡¢Ìúµç±¡Ä¤¼°Æä´æ´¢Æ÷5¡¢Î¢»úµç¹¤³Ì? [ÊÕÆð]
ͨѶ·½Ê½ :
°ì¹«µç»°£º**
µç×ÓÓʼþ£ºzhengxuejun@xtu.edu.cn
¸öÈ˼òÊö :
¡°±¡Ä¤²ÄÁϼ°ÆäÆ÷¼þÁ¦Ñ§¡± ÏæÌ¶´óѧÊ׸ö½ÌÓý²¿´´ÐÂÍŶӴøÍ·ÈË(2010)£¬¡°µÍά²ÄÁϼ°ÆäÆ÷¼þÁ¦Ñ§¡±ºþÄÏÊ¡¸ßУ¿Æ¼¼´´ÐÂÍŶӴøÍ·ÈË(2009)£¬½ÌÓý²¿³¤½Ñ§ÕßÌØÆ¸½ÌÊÚ(2009)£¬¹ú¼Ò½Ü³öÇàÄê»ù½ð(2008)£¬ºþÄÏÊ¡Ü½ÈØÑ§ÕßÌØÆ¸½ÌÊÚ(2007)¡£È«¹ú°ÙƪÓŲ©ÂÛÎÄÌáÃû½±(2005)¡£ÃÀ¹úÆ¥×ȱ¤´óѧ·ÃÎÊѧÕß(2005),ÏæÌ¶´óѧһ°ãÁ¦Ñ§ÓëÁ¦Ñ§»ù´¡²©Ê¿(2002), ÖÐÄÏ´óѧÇÅËí½á¹¹¹¤³Ì˶ʿ(1989),¹ú·À¿Æ´ó·ÉÐÐÆ÷¹ÌÌåÁ¦Ñ§±¾¿Æ(1985)¡£1985Äê7ÔÂ-2003Äê6Ô£¬ÖÐÄÏ´óѧÌúµÀѧԺÈÎÖú½Ì¡¢½²Ê¦¡¢¸±½ÌÊÚ¡£2003Äê6ÔÂ-2014Äê10Ô£¬ÏæÌ¶´óѧ½ÌÊÚ¡¢²©Ê¿Éúµ¼Ê¦£¬2006Äê10ÔÂ-2014Äê10Ô£¬ÈÎÏæÌ¶´óѧ²ÄÁÏÓë¹âµçÎïÀíѧԺ¸±Ôº³¤¡£2003Äê6ÔÂ-2011Äê10Ô£¬ÈÎÏæÌ¶´óѧ¡°µÍά²ÄÁϼ°ÆäÓ¦Óü¼Êõ½ÌÓý²¿ÖصãʵÑéÊÒ ¡±¸±Ö÷ÈΡ£2014Äê10ÔÂÖÁ½ñ£¬ÈÎÏæÌ¶´óѧ»úе¹¤³ÌѧԺѧԺԺ³¤¡£?
¿ÆÑй¤×÷ :
ÒÑÖ÷³ÖÍê³ÉµÄ¿ÆÑÐÏîÄ¿£º
1¡¢ÉϺ£ÊпÆÎ¯ÄÉÃ×רÏî(11nm**) , 2011-2014Äê¡£2¡¢µÍάÌúµç²ÄÁϵÄÖÆ±¸¡¢Á¦Ñ§±íÕ÷¼°Æä΢Æ÷¼þÓ¦Ó㬹ú¼Ò×ÔÈ»¿ÆÑ§»ù½ðÏîÄ¿½Ü³öÇàÄê»ù½ð(**), 2008-2012Äê¡£3¡¢îÑËáîéÄÆ»ù³ÚÔ¥ÐÍÎÞǦѹµç±¡Ä¤¼°Ïà¹ØÐÔÄÜ£¬¹ú¼Ò×ÔÈ»¿ÆÑ§»ù½ðÏîÄ¿(**), 2009-2011Äê¡£4¡¢×Ô×é×°°ëµ¼ÌåѹµçÄÉÃ×´ø¼°Ïà¹ØÐÔÄÜ£¬¹ú¼Ò×ÔÈ»¿ÆÑ§»ù½ðÏîÄ¿(**), 2007-2009Äê¡£5¡¢ZnO, ZnSѹµçÄÉÃ×´ø¼°ÎïÀíÁ¦Ñ§ÐÔÄÜ,¹ú¼Ò½ÌÓý²¿ºÍºþÄÏÊ¡½ÌÓýÌüÖØµãÏîÄ¿,2007-2009Äê¡£6¡¢×Ô×é×°°ëµ¼ÌåѹµçÄÉÃ×´ø¼°Ïà¹ØÁ¦Ñ§ÐÔÄÜ,¹ú¼Ò×ÔÈ»¿ÆÑ§»ù½ð(**), 2007-2009Äê¡£7¡¢ÎÞǦÌúµç±¡Ä¤¼°ÆäÄÉÃ×±¡Ä¤Î¢Æ÷¼þ£¬ºþÄÏÊ¡¿Æ¼¼¼Æ»®ÖصãÏîÄ¿£¬2005-2007Äê¡£8¡¢îé²ã×´¸ÆîÑ¿óÌúµç±¡Ä¤µÄÖÆ±¸¼°ÆäÈȳå»÷϶ÏÁÑʧЧÐÐΪ(**),¹ú¼Ò×ÔÈ»¿ÆÑ§»ù½ðÏîÄ¿,2005-2007Äê¡£9¡¢Ñ¹µç±¡Ä¤²ÄÁϵÄÖÆ±¸¼°Ïà¹ØÎïÀíÁ¦Ñ§ÐÔÄÜ,ºþÄÏÊ¡½ÌÓýÌüÇàÄê¹Ç¸É½Ìʦ»ù½ðÏîÄ¿,2003-2005Äê¡£10¡¢Ñ¹µç±¡Ä¤²ÄÁϵÄÖÆ±¸¼°Ïà¹ØÎïÀíÁ¦Ñ§ÐÔÄÜ,ºþÄÏÊ¡½ÌÓýÌüÇàÄêÏîÄ¿,2003-2005Äê¡£
ÔÚÑÐÖ÷³Ö¿ÆÑÐÏîÄ¿:
1¡¢GaN°ëµ¼ÌåÄÉÃײÄÁϵĶೡñîºÏʧЧ»úÀí(±àºÅ£º**), 2013-2016Äê¡£2¡¢±¡Ä¤²ÄÁϼ°ÆäÆ÷¼þÁ¦Ñ§ ½ÌÓý²¿¡°³¤½Ñ§Õ߼ƻ®¡±½±Àø¼Æ»® ½ÌÓý²¿´´ÐÂÍŶӹö¶¯×ÊÖúÏîÄ¿(IRT_14R48)3¡¢±¡Ä¤²ÄÁϼ°Æ÷¼þÁ¦Ñ§£¬½ÌÓý²¿¡°³¤½Ñ§Õ߼ƻ®¡±ÌØÆ¸½ÌÊÚÏîÄ¿([2009]17)
·¢Ã÷רÀû
1¡¢»ùÓÚµ¥¸ö¼«ÐÔ°ëµ¼ÌåÄÉÃ×´ø¹âµ¯»ÉµÄÖÆ×÷·½·¨ ֣ѧ¾ü¡¢³ÂÒåÇ¿¡¢Íõ¼×ÊÀ¡¢½ª´«±ó¡¢¹¨Â×¾ü ¹ú¼Ò·¢Ã÷רÀû, ZL **.2, 20112¡¢Ò»ÖÖ²âÁ¿ÄÉÃײÄÁϹâÖÂÓ²»¯ÐÔÄܵķ½·¨ ֣ѧ¾ü¡¢Íõ¼×ÊÀ¡¢³ÂÒåÇ¿¡¢Ñ¡¢¹¨Â×¾ü ¹ú¼Ò·¢Ã÷רÀû, ZL **.7, 20113¡¢Ò»ÖÖʵʱ²âÁ¿ÄÉÃײÄÁϹâÖÂÉìËõÐÔÄܵķ½·¨ ֣ѧ¾ü¡¢³ÂÒåÇ¿¡¢Íõ¼×ÊÀ¡¢¹¨Â×¾ü¡¢Ó๦³É ¹ú¼Ò·¢Ã÷רÀû, ZL **.3, 20124¡¢Ò»ÖÖ²âÁ¿Ñ¹µç²ÄÁÏѹµçϵÊýd15µÄ×¼¾²Ì¬·½·¨ ֣ѧ¾ü¡¢Åí½ð·å¡¢ÁõÑ«¡¢ÕÅÓ¡¢Ëï¾² ¹ú¼Ò·¢Ã÷רÀû, ZL **.7, 20155¡¢Ò»ÖÖÑõ»¯Ð¿ÄÉÃ×ÏßÉú³¤ËùÓõĴ߻¯¼Á¼°ÆäÓ¦Óã¬ÍõÏÖÓ¢¡¢Ð»äøèó¡¢Ö£Ñ§¾ü ÖйúרÀûºÅ£ºZL **9.0,20146¡¢Ñõ»¯ÎïÏ¡´Å°ëµ¼Ìå/ÌúµçÌåÒìÖʽṹ¼°ÆäÖÆ±¸·½·¨ Íõ½ð±ó¡¢ºÎ´º¡¢ÖÓÏòÀö¡¢ÖÜÒæ´º¡¢Ö£Ñ§¾ü ¹ú¼Ò·¢Ã÷רÀû, ZL **, 2010
³É¹û»ñ½±
1¡¢±¡Ä¤²ÄÁϼ°ÆäÆ÷¼þÁ¦Ñ§ ½ÌÓý²¿¡°³¤½Ñ§Õ߼ƻ®¡±½±Àø¼Æ»® ½ÌÓý²¿´´ÐÂÍŶӹö¶¯×ÊÖúÏîÄ¿2014 (ÅÅÃûµÚÒ»)2¡¢Î¢ÄɲÄÁϼ°Æ÷¼þµÄÁ¦Ñ§ÀíÂÛÉè¼ÆÓëÐÔÄܱíÕ÷·½·¨£¬ºþÄÏÊ¡×ÔÈ»¿ÆÑ§¶þµÈ½±2013 (ÅÅÃûµÚÒ»)3¡¢ÎÞǦÌúµç±¡Ä¤¼°ÆäÆ÷¼þµÄʧЧÓëÐÔÄܵ÷ÖÆ£¬ºþÄÏÊ¡×ÔÈ»¿ÆÑ§Ò»µÈ½±2012 (ÅÅÃûµÚ¶þ)4¡¢Ö¸µ¼Ë¶Ê¿Ñо¿ÉúÍõ¼×ÊÀ»ñºþÄÏÊ¡ÓÅÐã˶ʿѧλÂÛÎÄ(2012)5¡¢Ö¸µ¼Ë¶Ê¿Ñо¿ÉúÖ£»Ô»ñ¡°ÏæÌ¶´óѧµÚÊ®Áù½ìÑо¿ÉúУ³¤ÓÅÐã½±¡±(2011)6¡¢±¡Ä¤²ÄÁϼ°ÆäÆ÷¼þÁ¦Ñ§ ½ÌÓý²¿¡°³¤½Ñ§Õ߼ƻ®¡±½±Àø¼Æ»® ½ÌÓý²¿´´ÐÂÍŶÓ2010 (ÅÅÃûµÚÒ»)7¡¢µÍά²ÄÁϼ°ÆäÆ÷¼þÁ¦Ñ§ ºþÄÏÊ¡¸ßУ´´ÐÂÍŶÓ2010 (ÅÅÃûµÚÒ»)8¡¢±¡Ä¤²ÄÁϼ°Æ÷¼þÁ¦Ñ§£¬½ÌÓý²¿¡°³¤½Ñ§Õ߼ƻ®¡±ÌØÆ¸½ÌÊÚÏîÄ¿20099¡¢µÍάÎÞ»ú·Ç½ðÊô²ÄÁϼ°Î¢Æ÷¼þ£¬ºþÄÏÊ¡¡°Ü½ÈØÑ§Õ߼ƻ®¡±ÌØÆ¸½ÌÊÚÏîÄ¿2007 10¡¢²ôîðº¬Á¿¶ÔBi4-xEuxTi3 O12Ìúµç±¡Ä¤Î¢½á¹¹ºÍÌúµçÐÔÄܵÄÓ°Ï죬ºþÄÏÊ¡×ÔÈ»¿ÆÑ§ÓÅÐãѧÊõÂÛÎÄÒ»µÈ½± 2008(ÅÅÃûµÚÒ»)11¡¢Ñ¹µç±¡Ä¤µÄ¶ÏÁÑÈÍÐÔ¼°¼¤¹â×÷ÓÃÏÂµÄÆÆ»µ»úÖÆ£¬È«¹ú100ƪÓÅÐ㲩ʿѧλÂÛÎÄÌáÃû½±200512¡¢ºþÄÏÊ¡ÓÅÐ㲩ʿ±ÏÒµÂÛÎÄ ºþÄÏÊ¡ÈËÃñÕþ¸®Ñ§Î»Î¯Ô±»áºþÄÏÊ¡½ÌÓýÌü 200513¡¢ÄÉÃ×ѹºÛʵÑé²âÁ¿Pb(Zr0.52Ti0.48)03Ìúµç±¡Ä¤µÄ½çÃæÇ¿¶È£¬ºþÄÏÊ¡×ÔÈ»¿ÆÑ§ÓÅÐãѧÊõÂÛÎÄÒ»µÈ½±2004(ÅÅÃûµÚÒ»)14¡¢ÏæÌ¶ÊÐ2001-2003Äê¶È×ÔÈ»¿ÆÑ§ÓÅÐãѧÊõÂÛÎÄÒ»µÈ½± ÏæÌ¶ÊпÆÑ§¼¼Êõлá ÏæÌ¶ÊÐÈËÊÂ¾Ö 2004(ÅÅÃûµÚÒ»)15¡¢²ÄÁÏÁ¦Ñ§¼ÆËã»ú¸¨Öú½ÌѧµÄÑо¿Óëʵ¼ù ºþÄÏÊ¡ÓÅÐã½Ìѧ³É¹û¶þµÈ½± 1997.7£¨ÅÅÃûµÚÈý£©18¡¢L. L Wang, X. J. Luo, X. J. Zheng*, R. Wang and T. Zhang. Direct annealing of electrospun synthesized high-performance porous SnO2 hollow nanofibers for gas sensors, RSC Adv. 3 (2013), 9723-9728 (SCIÔ´¿¯,Ó°ÏìÒò×Ó2.562)19¡¢Yanchao She, Xuejun Zheng, Denglong Wang, and Weixi Zhang. Controllable double tunneling induced transparency and solitons formation in a quantum dot molecule. Optics Express 21 (2013), 17392-17403. (SCIÔ´¿¯,Ó°ÏìÒò×Ó3.546)20¡¢Y. Wei, H. B. Cheng, X. Y. Wang, and X. J. Zheng. Evaluation on residual stress in Bi3.15(Eu0.7Nd0.15)Ti3O12 polycrystalline ferroelectric thin film by using the orientation average method. Applied Physics Letters, 101, 901-909 (2012). (SCIÔ´¿¯,Ó°ÏìÒò×Ó3.82)21¡¢Y. Wei, L. H. Xu, Y. W. Tao, X. J. Zheng, J. H. Yang, D. F. Zou, and S. X. Mao. Width-to-thickness ratio dependence on photoplastic effect of ZnS nanobelt. Applied Physics Letters, 101, 901-904 (2012). (SCIÔ´¿¯,Ó°ÏìÒò×Ó3.82) 22¡¢L. H. Xu, D. D. Jiang, and X. J. Zheng. Effect of grain orientation in x-ray diffraction pattern on residual stress in polycrystalline ferroelectric thin film. Journal of Applied Physics 112, 513-521 (2012). (SCIÔ´¿¯,Ó°ÏìÒò×Ó2.497)23¡¢X. Liu, X.J. Zheng, J.Y. Liu, K.S. Zhou, D.H. Huang. Effect of annealing temperature on the electrostrictive properties of 0.94(Na0.5Bi0.5)TiO3-0.06BaTiO3 thin films. Journal of Electroceramics, 29(3) (2012), 270-276. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.194)24¡¢S.T. Song, X.J. Zheng, H. Zheng, W. Liu. Evaluation of engineering/ piezoelectric constants of piezoelectric thin film by combining nanoindentation test with FEM. Computational Materials Science, 63 (2012), 134-144. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.522)25¡¢Y. Zhang, X. J. Zheng, X. L. Zhong and S. F. Deng. The ethanol sensing characteristics of ZnO thin films with low operating temperatures synthesized by pulsed laser deposition. Measurement Science and Technology, 23 (2012), 105-107. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.352)26¡¢S.T. Peng, X.J. Zheng, J. Sun, Y. Zhang, L. Zhou, J. H. Zhao, S. F. Deng, M. F. Cao, W. Xiong, K. Peng. Modeling of a micro-cantilevered piezo-actuator considering the buffer layer and electrodes. J. Micromech. Microeng. 22 (2012), 065-075. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.105)27¡¢J. H. Zhao, X. J. Zheng, L. Zhou, Y. Zhang , J. Sun, W.J. Dong, S.H. Deng, S.T. Peng. Investigation of a d15 mode PZT-51 piezoelectric energy harvester with a series connection structure. Smart Mater. Struct. 21 (2012), 105-109. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.089).28¡¢Y. Q. Gong, H. Dong, X. J. Zheng, J. F. Peng, X. J. Li, R. J. Huang. Large piezoelectric response of Bi0.5(Na(1?x)Kx)0.5TiO3 thin films near morphotropic phase boundary identified by multi-peak fitting. J. Phys. D: Appl. Phys. 45 (2012), 301-305. (SCIÔ´¿¯,Ó°ÏìÒò×Ó2.544)29¡¢L. Zhou, J. Sun, X. J. Zheng, S. F. Deng, J. H. Zhao, S. T. Peng. Y. Zhang, X. Y. Wang and H. B. Cheng. A model for the energy harvesting performance of shear mode piezoelectric cantilever, Sensors and Actuators A. 179 (2012), 185-192. (SCIÔ´¿¯,Ó°ÏìÒò×Ó1.802)30¡¢J. Sun, X. J. Zheng, W. Li, A model for the electrical characteristics of metal-ferroelectric-insulator-semiconductor field-effect transistor. Current Applied Physics, 12(2012), 760-764.31¡¢Y. Zhang, X.J. Zheng, X. L. Zhong, S. F. Deng. The ethanol sensing characteristics of ZnO thin films with low operating temperatures synthesized by pulsed laser deposition. Meas. Sci. Technol. 23(2011),105-107.32¡¢X. J. Zheng, X. C. Cao, J. Sun, B. Yuan, Q. H. Li, Z. Zhu, Y. Zhang, A vacuum pressure sensor based on ZnO nanobelt film, Nanotechnology, 22(2011), 495-501 (1-6).33¡¢Y. Zhang, X. J. Zheng, T. Zhang, Characterization and humidity sensing properties of Bi0.5Na0.5TiO3-Bi0.5K0.5TiO3 powder synthesized by metal-organic decomposition, Sensors and Actuators B: Chemical, 156(2011), 887-892.34¡¢J. Sun, X. J. Zheng, J. Cao, W. Li, Interface effects on the characteristics of metal-ferroelectric-insulator-semiconductor ?eld-effect transistor, Semicond. Sci. Technol., 26(2011), 093-097 (1-6).35¡¢J. Sun, X. J. Zheng, Modeling of MFIS-FETs for the application of ferroelectric random access memory. IEEE Transactions on Electron Devices, 58(2011) 55-59.36¡¢Z. Zhu, X. J. Zheng, D. D. Jiang, Z. C. Yang, The threshold electric field of 180¡ã domain switching in the misfit strain-external electric field phase diagram. J. Appl. Phys, 110(2011), 032-035.37¡¢H. Dong, X. J. Zheng, W. Li, Y. Q. Gong, J. F. Peng, Z. Zhu, The dielectric relaxation behavior of (Na0.82K0.18)0.5Bi0.5TiO3 ferroelectric thin film. J. Appl. Phys., 110(2011), 119-124.38¡¢H. Zheng, X. J. Zheng, S. T. Song, J. Sun, F. Jiao, W. Liu, G. Y. Wang, Evaluation of the elastic modulus of thin film considering the substrate effect and geometry effect of indenter tip. Computational Materials Science, 50(2011), 26-30.39¡¢Y. Zhang, X. J. Zheng, T. Zhang, J. Sun, Y. Bian, J. Song, Gas sensing properties of coral-like Bi0.5K0.5TiO3 powders synthesized by metal-organic decomposition. Meas. Sci. Technol. 22(2011), 195-205.40¡¢J. Sun, X. J. Zheng, W. Yin, M. H. Tang, W. Li, Influences of space charge and electrode on the electrical transport through (Ba,Sr)TiO3 thin film capacitors. Applied Surface Science, 257(2011), 4990-4993.41¡¢B. Yuan, X. J. Zheng, Y. Q. Chen, B. Yang, T. Zhang, High photosensitivity and low dark current of photoconductive semiconductor switch based on ZnO single nanobelt, Solid-State Electronics, 55(2011), 49-53.42¡¢Y. Q. Chen, Y. F. En, Y. Huang, X. D. Kong, X. J. Zheng, and Y. D. Lu, Effects of surface tension and axis stress on piezoelectric behaviors of ferroelectric nanowires. Applied Physics Letters, 99, (2011), 203106-203108 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.726)43¡¢Y. Q. Chen, Y. F. En, Y. Huang, X. D. Kong, W. X. Fang, and X. J. Zheng, Effects of Stress and Depolarization on Electrical Behaviors of Ferroelectric Field-Effect Transistor. IEEE ELECTRON DEVICE LETTERS, 99,(2011), 1-3(SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.714)44¡¢H. Zheng, X. J. Zheng, J. S. Wang, G. C. Yu, Y. Li, S. T. Song, C. Han, Evaluation the effect of aspect ratio for Young¡¯s modulus of nanobelt using finite element method. Materials and design, 32,(2011), 1407-1413 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.518)45¡¢J. Sun, X. J. Zheng, W. Yin, M. H. Tang, W. Li, Space-charge-limited leakage current in high dielectric constant and ferroelectric thin films considering the field-dependent permittivity. Appl. Phys. Lett., 97.24 (2010): 242905 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.726)46¡¢H. Zheng, X. J. Zheng, J. S. Wang, G. C. Yu, Y. Li, S. T. Song, C. Han, Evaluation the effect of aspect ratio for Young¡¯s modulus of nanobelt using finite element method. Materials and design, 32.3 (2011): 1407-1413 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.518)47¡¢B. Yuan,X. J. Zheng, Y. Q. Chen, B. Yang, T. Zhang, High photosensitivity and low dark current of photoconductive semiconductor switch based on ZnO single nanobelt. Solid-State Electronics, 55, (2011), 49-53. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.422)48¡¢Y. Q. Chen, X. J. Zheng, W. Li, Modeling of flexoelectric effect on capacitor-voltage and memory window of metal-ferroelectric-insulator-silicon capacitor. Appl. Phys. Lett., 96, (2010), 233501 (1-3) (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.726)49¡¢X. J. Zheng, G. C Yu, Y. Q. Chen, S. X. Mao, T. Zhang, Photoinduced stiffening and photoplastic effect of ZnS individual nanobelt in nanoindentation. J. Appl. Phys., 108, (2010), 094305. (SCIÔ´¿¯,Ó°ÏìÒò×Ó2.497)50¡¢X. J. Zheng, Q. Y. Wu, J. F. Peng, L. He, X. Feng, Y. Q. Chen, D. Z. Zhang, Annealing temperature dependence of effective piezoelectric coefficients for Bi3.15Eu0.85Ti3O12 thin films. J. Mater. Sci., 45, (2010), 3001-3006. (SCIÔ´¿¯,Ó°ÏìÒò×Ó1.181)51¡¢X. J. Zheng, J. F. Peng, Y. Q. Chen, L. He, X. Feng, D. Z. Zhang, L. J. Gong, Q. Y. Wu, Enhancement on effective piezoelectric coefficient of Bi3.25Eu0.75Ti3O12 ferroelectric thin films under moderate annealing temperature. Thin Solid Films, 519,(2010), 714-718. (SCIÔ´¿¯,Ó°ÏìÒò×Ó1.884)52¡¢D. Z. Zhang, X. J. Zheng, X. Feng, T. Zhang, J. Sun, S. H. Dai, L .J. Gong, Y. Q. Gong, L. He, Z. Zhu, J. Huang, X. Xu, Ferro-piezoelectric properties of 0.94(Na0.5Bi0.5)TiO3¨C0.06BaTiO3 thin film prepared by metal¨Corganic decomposition. Journal of Alloys and Compounds, 504,(2010), 129-133. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.135)53¡¢J. S. Wang, X. J. Zheng , H. Zheng, S. T. Song, Z. Zhu, Identification of elastic parameters of transversely isotropic thin films by combining nanoindentation and FEM analysis. Computational Materials Science, 49,(2010), 378-385. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.522)54¡¢Y. Q. Chen, X. J. Zheng, W. Li,Size effect of mechanical behavior for lead-free(Na0.82K0.18)0.5Bi0.5TiO3 nanofibers by nanoindentation. Materials Science and Engineering A, 527.21 (2010): 5462-5466. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.806)55¡¢Y. Q. Chen, X. J. Zheng, X. Feng, The fabrication of vanadium-doped ZnO piezoelectric nanofiber by electrospinning. Nanotechnology, 21,(2010), 055708. (SCIÔ´¿¯,Ó°ÏìÒò×Ó3.446)56¡¢X. J. Zheng, Y. Q. Chen, T. Zhang, B. Yang, C. B. Jiang, B. Yuan, Z. Zhu, Photoconductive semiconductor switch based on ZnS nanobelts film. Sensors and Actuators B., 147,(2010) , 442-446 (SCIÔ´¿¯,Ó°ÏìÒò×Ó3.122)57¡¢Y. Zhang, X. J. Zheng, T. Zhang, L. J. Gong, S. H. Dai, Y. Q. Chen, Humidity sensing properties of the sensor based on Bi0.5K0.5TiO3 powder. Sensors and Actuators B., 147,(2010), 180-184 (SCIÔ´¿¯,Ó°ÏìÒò×Ó3.122)58¡¢X. J. Zheng, Y. Q. Chen, T. Zhang, C. B. Jiang, B. Yang, B. Yuan, S. X. Mao, W. Li, A photoconductive semiconductor switch based on an individual ZnS nanobelt. Scripta Materialia, 62,(2010), 520-523 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.887)59¡¢Y. Q. Chen, X. J. Zheng, S. X. Mao, W. Li, Nanoscale mechanical behavior of vanadium doped ZnO piezoelectric nanofiber by nanoindentation technique. J. Appl. Phys., 107,(2010), 094302 (1-5) (SCIÔ´¿¯,Ó°ÏìÒò×Ó2.497)60¡¢Y. Q. Chen, X. J. Zheng, X. Feng, S. H. Dai, D. Z. Zhang, Fabrication of lead-free (Na0.82K0.18)0.5Bi0.5TiO3 piezoelectric nanofiber by electrospinning. Materials Research Bulletin, 45,(2010), 717-721 (SCIÔ´¿¯,Ó°ÏìÒò×Ó1.812)61¡¢X. J. Zheng, Y. F. Rong, D. Z. Zhang, T. Zhang, L. He, X. Feng, Enhancement on effective piezoelectric coefficient d33 of Bi3.15Dy0.85Ti3O12 ferroelectric thin films. Materials Letters, 64,(2010), 618-621 (SCIÔ´¿¯,Ó°ÏìÒò×Ó1.748)62¡¢J. S. Wang, X. J. Zheng, H. Zheng, Z.Zhu, S. T. Song, Evaluation of the substrate effect on indentation behavior of film/substrate system. Applied Surface Science, 256,(2010), 3316-3320 (SCIÔ´¿¯,Ó°ÏìÒò×Ó1.576)63¡¢Z. Zhu, X. J. Zheng, W. Li, Multilayer growth of BaTiO3 thin films via pulsed laser deposition: An energy-dependent kinetic Monte Carlo simulation. Applied Surface Science, 256,(2010), 5876-5881 (SCIÔ´¿¯,Ó°ÏìÒò×Ó1.576)64¡¢X. J. Zheng, S. H. Dai, X. Feng, T. Zhang, D. Z. Zhang, Y. Q. Gong, Y. Q. Chen, L. He, Structural and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films deposited on LaNiO3 and Pt bottom electrodes. Applied Surface Science, 256,(2010), 3316-3320 (SCIÔ´¿¯,Ó°ÏìÒò×Ó1.576)65¡¢Y. Q. Chen, X. J. Zheng, L. He, X. Feng, Annealing temperature-dependent piezoelectric properties of Bi3.15Nd0.85Ti3O12 ferroelectric thin films. Phys. Status Solidi A, 207,(2010), 1240-1244 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.205)66¡¢Y. Q. Gong, X. J. Zheng, L. J. Gong, Y. Ma, D. Z. Zhang, S. H. Dai, X. J. Li, Effects of annealing temperature on microstructure and ferroelectric properties of Bi0.5(Na0.85K0.15)0.5TiO3 thin films. Trans. Nonferrous Met. Soc.China, 20,(2010), 1906-1910. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.321)67¡¢H. P. Hu, S. H. Dai, X. J. Zheng, Y. C. Zhou, X. Feng, D. Z. Zhang, L. He, Thermal and piezoelectric properties of Bi3.15Nd0.85Ti3O12 thin film prepared by metal organic decomposition. Trans. Nonferrous Met. Soc.China, 20,(2010), 1424-1428. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.321)68¡¢X. J. Zheng, B. Yang , T. Zhang, C. B. Jiang, S. X. Mao, Y. Q. Chen, B. Yuan, Enhancement in ultraviolet optoelectronic performance of photoconductive semiconductor switch based on ZnO nanobelts. Appl. Phys. Lett., 95,(2009), 221106 (1-3) (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4. 308)69¡¢Z. Zhu, X. J. Zheng, W. Li, Submonolayer growth of BaTiO3 thin film via pulsed laser deposition: A kinetic Monte Carlo simulation. J. Appl. Phys., 106, (2009), 054105. (SCIÔ´¿¯,Ó°ÏìÒò×Ó2.497)70¡¢Y. Q. Chen, X. J. Zheng, X. Feng, D. Z. Zhang, S. H. Dai, Lead-free piezoelectric (Na0.5Bi0.5)0.94TiO3¨CBa0.06TiO3 nanofiber by electrospinning. Phys. Status Solidi RRL., 3, (2009), 290-292 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.147)71¡¢X. J. Zheng, W. Yin, T. Zhang, Y. Q. Chen, M. H. Tang, J. Sun, Effect of the abnormal electric field induced by the passive layer on imprint failures of ferroelectric capacitors. Phys. Status Solidi RRL., 3, (2009), 251-253 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.147)72¡¢B. Wu, X. J. Zheng, H. P. Hu, D. H. Li, Y. Ma, Y. C. Zhou, Near tip stress intensity factor for an edge-crack in a Pb(ZrxTi1-x)O3 thin ?lm with 90¡ã domain switching under a continuous laser irradiation. Engineering Fracture Mechanics, 76,(2009), 1811-1821 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.713)73¡¢D. H. Li, X. J. Zheng, B. Wu, Y. C. Zhou, Fracture analysis of a surface through-thickness crack in PZT thin film under a continuous laser irradiation. Engineering Fracture Mechanics, 76,(2009), 525-532 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.713)74¡¢J. J. Zhang, J. Sun, X. J. Zheng, A model for the C-V characteristics of the metal¨Cferroelectric¨Cinsulator¨Csemiconductor structure. Solid-State Electronics, 53, (2009), 170-175 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.259)75¡¢R. Wang, Y. He, T. Zhang, Z. Wang, X. J. Zheng, L. Niu, DC and AC analysis of humidity sensitive properties based on K+ doped nanocrystalline LaCo0.3Fe0.7O3. Sensors and Actuators B: Chemical. 136,(2009), 536-540 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.122)76¡¢Q. Qi, T. Zhang, L. Liu, X. J. Zheng, Synthesis and toluene sensing properties of SnO2 nano?bers. Sensors and Actuators B: Chemical. 137,(2009), 471-475 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.122)77¡¢Q. Qi, T. Zhang, S. Wang, X. J. Zheng, Humidity sensing properties of KCl-doped ZnO nanofibers with super-rapid response and recovery. Sensors and Actuators B: Chemical. 137,(2009), 649-655 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.122)78¡¢Q. Qi, T. Zhang, X. J. Zheng, L. Wan. Preparation and humidity sensing properties of Fe-doped mesoporous silica SBA-15. Sensors and Actuators B: Chemical. 135,(2008), 255-261 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.122)79¡¢Q. Qi, T. Zhang, L. Liu, X. J. Zheng,, Q. Yu, Y. Zeng, et al. Selective acetone sensor based on dumbbell-like ZnO with rapid response and recovery. Sensors and Actuators B: Chemical. 134,(2008), 166-170 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.122)80¡¢Q. Qi, T. Zhang, X. J. Zheng, H. Fan, L. Liu, R. Wang, et al. Electrical response of Sm2O3-doped SnO2 to C2H2 and effect of humidity interference. Sensors and Actuators B: Chemical. 134, (2008), 36-42 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó3.122)81¡¢X. J. Zheng, J. Sun, J. J. Zhang, M. H. Tang, W. Li, Evaluation of capacitance-voltage characteristic and memory window of metal-ferroelectric-insulator-silicon capacitors. Appl. Phys. Lett., 93,(2008), 213501 (1-3) (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4. 308)82¡¢Z. Zhu, X. J. Zheng, W. Li, Kinetic Monte Carlo simulation of RHEED from BaTiO3 thin films. Physica B, 403,(2008), 4074-4078 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0. 908)83¡¢F. Yang, M. H. Tang, Y. C. Zhou, F. Liu, Y. Ma, X. J. Zheng et al. Fatigue mechanism of the ferroelectric perovskite thin films. Appl. Phys. Lett. 92(2) (2008), 022908(1-3). (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4.127)84¡¢L. P. Tang, S. H. Xie, X. J. Zheng, et al. Domain switching in ferroelectric ceramics beyond Taylor bound. Mechanics of Materials 40(2008), 362-376. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.106)85¡¢X. J. Zheng, L. He, M. H. Tang, Y. Ma, J. B. Wang, Q. M. Wang. Enhancement of fatigue endurance and retention characteristic in Bi3.25Eu0.75Ti3O12 thin film. Materials Letters 62 (2008), 2876-2879. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.353)86¡¢X. J. Zheng Y. G. Lu, L. He, Y. Q. Gong.Nanoscale domain switching in Bi3.15Eu0.85Ti3O12 thin films annealed at different temperature by scanning probe microscopy. Materials Letters 62 (2008), 440-442 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.353)87¡¢Z. Ye, M. H. Tang, Y. C. Zhou, X. J. Zheng Modeling of imprint in hysteresis loop of ferroelectric thin films with top and bottom interface layers. Appl. Phys. Letts, 90 (2007), 042902 (1-3) (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4.127)88¡¢F. Yang, M. H. Tang, Y. C. Zhou, X. J. Zheng, F. Liu, J. X. Tang, J. J. Zhang, J. Zhang, and Chang Q. Sun A model for the polarization hysteresis loops of the perovskite-type ferroelectric thin films. Appl. Phys. Letts, 91 (2007), 142902 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4.127)89¡¢Z. Ye, M. H. Tang, Y. C. Zhou, X. J. Zheng Electrical properties of V-doped Bi3.15Nd0.85Ti3O12 thin films with different contents. Appl. Phys. Letts, 90 (2007), 082905 (1-3) (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4.127)90¡¢J. Zhang, M. H. Tang, J. X. Tang, F. Yang, H. Y. Xu, W. F. Zhao, X. J. Zheng, Y. C. Zhou, and J. He Bilayer model of polarization offset of compositionally graded ferroelectric thin films. Appl. Phys. Letts, 91 (2007), 162908 (1-3) (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4.127)91¡¢X. L. Zhong, J. B. Wang, L. Z. Sun, C. B. Tan, X. J. Zheng, and Y. C. Zhou Improved ferroelectric properties of bismuth titanate films by Nd and Mn cosubstitution. Appl. Phys. Lett., 90(1), (2007), 012906 (1-3) (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4.127)92¡¢F. Yang, M. H. Tang, Z. Ye, Y. C. Zhou, X. J. Zheng, J. X. Tang, J. J. Zhang and J. He Eight logic states of tunneling magneto-electroresistance in multiferroic tunnel junctions. Journal of Applied Physics, 102 (2007), 044504(1-5) (SCIÔ´¿¯,Ó°ÏìÒò×Ó2.497)93¡¢X. J. Zheng, et al. The Effects of annealing temperature on the properties of Bi3.15Nd0.85 Ti3O12 thin films. Scripta Materialia 57 (2007) 675-678 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.112)94¡¢M. H. Tang, Y. C. Zhou, X. J. Zheng. Electrical Properties of Metal-Ferroelectric -Insulator-Semiconductor Capacitors using Pt/ (Bi3.15Nd0.85)(Ti3-xVx)O12/Y2O3/Si Structure. Integrated Ferroelectrics, 94 (2007), 105-114(SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.427)95¡¢M. H. Tang, Y. C. Zhou, X. J. Zheng. Structural and electrical properties of metal-ferroelectric-insulator-semiconductor transistors using a Pt/Bi3.25Nd0.75Ti3O12/Y2O3/Si structure. Solid State Electronics, 51 (2007), 371-375(SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.210)96¡¢C. P. Cheng, M.H. Tang, Z. Ye, X. L. Zhong, X. J. Zheng, Y. C. Zhou, Z. S. Hu Structure evolution and ferroelectric properties of Bi3.4Yb0.6Ti3O12 thin films crystallized under a moderate temperature. Materials Letters, 61 (2007), 3563 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.353)97¡¢C. P. Cheng, M. H. Tang, Z. Ye, Y. C. Zhou, X. J. Zheng Microstructure and ferroelectric properties of dyprosia-doped bismuth titanate thin films. Materials Letters, 61 (2007), 4117-4120(SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.353)98¡¢X. J. Zheng, J. J. Zhang, Y. C. Zhou, Y. Q. Chen, Y. Bo Simulation of electric properties of MFIS capacitor with BNT ferroelectric thin film using Silvaco/Atlas. Trans. Nonferrous Met. Soc.China17(s1), (2007), 752-755(SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.277)99¡¢X. J. Zheng, B. Yang, Z. Zhu, B. Wu, Y. L. Mao Kinetic Monte Carlo Simulation of the Growth of BaTiO3 Thin Film via Pulsed Laser Deposition. Trans. Nonferrous Met. Soc.China17(6), (2007), 1441-1446(SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.277)100¡¢X. J. Zheng, J.Lu, Y. C. Zhou, B. Wu, Y. Q. Chen.Evolution of the domain structure and the frequency effect on the ferroelectric properties in BIT ferroelectrics. Trans. Nonferrous Met. Soc.China17(s1), (2007), 64-68(SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.277)101¡¢X. J. Zheng, L. P. Tang, Q. Y. Wu, B. Wu.Evaluation of the effective elastic constants for polycrystalline PZT thin films by XRD patterns and pole figures. Journal of Central South University of Technology. 14(s1), (2007), 130-134(SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.277)102¡¢J. X. Tang, M. H. Tang, F. Yang, J. J. Zhang, Y. C. Zhou, and X. J. Zheng A temperature-dependent model for kink effect of partially depleted SOI MOSFETs. Journal of Functional Materials, 38 (2007), 872-877103¡¢X. J. Zheng, L. He, Y. C. Zhou, M. H. Tang. Effects of europium content on the microstructural and ferroelectric properties of Bi(4?x)EuxTi3O12 thin films. Appl. Phys. Lett. (2006), 89: 252908 (1-3) (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4.127)104¡¢Z. Ye, M. H. Tang, C. P. Cheng, Y. C. Zhou, X. J. Zheng, Z. S. Hu. Simulation of polarization and butterfly hysteresis loops in bismuth layer-structured ferroelectric thin films. J. Appl. Phys. 100(2006), 094-101. (SCIÔ´¿¯,Ó°ÏìÒò×Ó2.497)105¡¢M. H. Tang, Y. C. Zhou, X. J. Zheng, Z. Yan, C. P. Cheng, Z. Ye, Z. S. Hu. Characterization of ultra-thin Y2O3 films as insulator of MFISFET structure. Trans. Nonferrous Met. SOC. China 16(2006), 63-66. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.277)106¡¢C. P. Cheng, M. H. Tang, Z. Ye, Y. C. Zhou, X. J. Zheng. Ferroelectric properties of dysprosium-doped Bi4Ti3O12 thin films crystallized in various atmospheres. Trans. Nonferrous Met. SOC. China 16(2006), 33-36. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.277)107¡¢Z. Ye, M. H. Tang, C. P. Cheng,Y. C. Zhou, X. J. Zheng, Z. S. Hu. Effect of annealing temperature on ferroelectric properties of (Bi, Nd)4(Ti,V)3O12 thin films. Trans. Nonferrous Met. SOC. China 16(2006), 71-74. (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.277)108¡¢X. Tan, Y. C. Zhou and X. J. Zheng. Pulsed-laser deposition of polycrystalline Ni films: a three-dimensional kinetic Monte Carlo simulation, Surface Sci.,588(1-3) (2005), 175-183 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó2.168)109¡¢X. J. Zheng and Y. C. Zhou, Investigation of an anisotropic plate model to evaluate the interface adhesion of thin film with cross-sectional nanoindentation method, Composites Sci. Tech., (2005),1382-1390 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.783)110¡¢X. L. Zhong, J. B. Wang, Y. C. Zhou, J. J. Liu, X. J. Zheng, Electrical properties of Nd-substrated Bi4Ti3O12 thin films fabricated by chemical solution deposition, J. Crystal Growth, 277 (1-4),(2005), 233-237 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.707)111¡¢X. Tan, X. J. Zheng and Y. C. Zhou, Dependence of morphology of pulsed-laser deposited coatings on temperature: a kinetic Monte Carlo simulation, Surface and Coating Technology, 197(2-3), (2005), 288-293 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.432)112¡¢X. Tan, Y. C. Zhou, and X. J. Zheng, Comparison of island formation between pulsed laser deposition and molecular beam epitaxy, Surface review and letters, 12(2005), 611- 617 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.675 )113¡¢X. J. Zheng, J. Y. Li and Y. C. Zhou. X-ray diffraction measurement of residual stress in PZT thin films prepared by pulsed laser deposition. Acta Mater., 52,(2004), 3313-3322. SCIÓ°ÏìÒò×Ó3.059114¡¢X. J. Zheng, S. F. Deng, Y. C. Zhou, X. Tan. Plate model to evaluate interfacial adhesion of anisotropy thin film in CSN test. Journal of Materials Science. 2004£¬39(12), 4013-4016. SCIÓ°ÏìÒò×Ó0.826115¡¢X. L. Zhong, X. J. Zheng, J. T. Yang. Dependence of Ba(Zr0.1Ti0.9)O3 films growth on substrate temperature upon radio-frequency plasma enhanced pulsed laser deposition, Journal of Crystal Growth, 271(1-2)(2004),216-222 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó1.707)116¡¢X. L. Zhong, J. B. Wang, X. J. Zheng, Y. C. Zhou. Structure and ferroelectric and dielectric properties of Bi3.5Nd0.5Ti3O12 thin films under a moderate temperature annealing, Appl. Phys. Lett.,85(23)(2004), 5661-5663 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó4.127)117¡¢S. F. Deng, X. J. Zheng, J. T.Yang.X-ray Diffraction Measurement of Residual Stress in PZT Thin Films Prepared by MOD with the New Extended Model. Journal of Materials Science and Technology, 52.11 (2004), 3313-3322 (SCIÔ´¿¯£¬Ó°ÏìÒò×Ó0.329)118¡¢X. J. Zheng, Y. C. Zhou and J. Y. Li. Nano-indentation fracture test of Pb(Zr0.52Ti0.48)O3 ferroelectric thin films. Acta Mater., 51, (2003), 3985-3997. SCIÓ°ÏìÒò×Ó3.059119¡¢X. J. Zheng, Y. C. Zhou, H. Zhong. Dependence of fracture toughness on annealing temperature in PZT thin films produced by metal organic decomposition. Journal of Materials Research, 18(3), (2003), 578-584. SCIÓ°ÏìÒò×Ó1.635120¡¢X. J. Zheng, Z.Y.Yang and Y. C. Zhou. Residual stresses in Pb(Zr0.52Ti0.48)O3 thin films deposited by metal organic decomposition. Scripta Materialia, 49(1), (2003)£¬71-76. SCIÓ°ÏìÒò×Ó1.633121¡¢X. J. Zheng, Y. C. Zhou, J. M. Liu and A. D. Li. Use of the nanomechanical fracture-testing for determining interfacial adhesion of PZT ferroelectrics thin films. Surface and Coating Technology, 176, (2003), 67-74. SCIÓ°ÏìÒò×Ó1.410122¡¢X. J. Zheng, Y. C. Zhou, J. M. Liu and A. D. Li. Determination of interfacial fracture energy of PZT ferroelectric thin films by nano-scratch technique. Journal of Materials Science Letters, 22(10) , (2003)£¬743-745. SCIÓ°ÏìÒò×Ó0.470123¡¢X. J. Zheng, Y. C. Zhou£¬Z. Yan. Dependence of Crystalline, Ferroelectric and Fracture Toughness on Annealing in Pb(Zr0.52Ti0.48)O3 Thin Films Deposited by Metal Organic Decomposition. Materials Research, 6(4), (2003)£¬551-556.124¡¢Y. C. Zhou, Z. Y. Yang, X. J. Zheng. Residual stress in PZT thin films prepared by pulsed laser deposition. Surface and Coating Tech., 162(2-3), (2003)£¬202-211. SCIÓ°ÏìÒò×Ó1.410125¡¢X. J. Zheng, Y. C. Zhou, M. Z. Nin. Thermopiezoelectric response of a piezoelectric thin film PZT-6B deposited on MgO (100) substrate due to a continuous laser. Int. J. Solid Structure, 39(15), (2002), 3935-3957. SCIÓ°ÏìÒò×Ó1.327126¡¢X. J. Zheng, Y. C. Zhou, J. M. Liu and A. D. Li. Interfacial adhesion analysis of Pb(Zr0.52Ti0.48)O3 ferroelectrics thin films by nano-indentation test. Phys Lett A, 304(3-4), (2002)£¬110-113. SCIÓ°ÏìÒò×Ó1.324127¡¢Z. Y. Yang, Y. C. Zhou, X. J. Zheng, Z. Yan and G. Bignall. The determination of residual stress in PZT thin film prepared by pulsed laser deposition. Journal of Materials Science Letters, 21(19), (2002)£¬1541-1544. SCIÓ°ÏìÒò×Ó0.470
ÏæÌ¶´óѧöλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-֣ѧ¾ü
±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø/2019-05-27
Ïà¹Ø»°Ìâ/²ÄÁÏ ÄÉÃ× Á¦Ñ§ ÅÅÃû ÓÅÐã
Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-½¯µÀ½¨
µ¼Ê¦ÐÕÃû£º½¯µÀ½¨ÐÔ±ð£ºÈËÆøÖ¸Êý£º214ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£ºÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£º¸öÈ˼òÊö:³¤ÆÚ´ÓÊÂÏȽø³£¹æÎäÆ÷ÑÐÖÆ£¬×éÖ¯Á˶àÏîÖØµãÎäÆ÷ÐͺÅÑо¿¹¤×÷£¬Ä¿Ç°Ö÷Òª´ÓÊÂÕ¨Ò©¼°ÆäÓ¦Óá¢ÏȽøµ¯Ò©¹¤³Ì¡¢ÖØ´ó×°±¸Ñо¿µÈ¹¤×÷¡£¸ºÔð¹ú¼Ò¿Æ¼¼ÖØ´óרÏî¿ÎÌâ1Ïî£¬ÖØµã×°±¸Ñо¿£¨ÑÐ ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-27Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-Íõ½¨»ª
µ¼Ê¦ÐÕÃû£ºÍõ½¨»ªÐÔ±ð£ºÈËÆøÖ¸Êý£º152ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£ºÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£ºÑо¿ÁìÓò£º¸ß·Ö×Ó²ÄÁÏÑо¿ÁìÓò£º¸ß·Ö×Ó²ÄÁÏ[ÊÕÆð]¸öÈ˼òÊö:ËÄ´¨Ê¡Ñ§Êõ¼¼Êõ´øÍ·È˺ó±¸ÈËÑ¡¡£±¬Õ¨¿ÆÑ§Óë¼¼Êõ¹ú¼ÒÖØµãʵÑéÊÒ£¨±±¾©Àí¹¤´óѧ£©¡¢ÏȽøÌØÖÖ²ÄÁÏÖÆ±¸¼Ó¹¤Ð¼¼Êõ½ÌÓý²¿ÖصãʵÑé ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-27Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-Àî¾´Ã÷
µ¼Ê¦ÐÕÃû£ºÀî¾´Ã÷ÐÔ±ð£ºÈËÆøÖ¸Êý£º112ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£ºÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£º¸öÈ˼òÊö:ÏÖÈÎÈýËù¿Æ¼¼Î¯¸±Ö÷ÈΡ¢Ñо¿Ô±¡£Ö÷Òª´ÓʲÄÁÏÎïÀíÐÔÄܱíÕ÷¡¢²ÄÁϼ°²¿×é¼þ»·¾³ÊÊÓ¦ÐÔ¡¢²ÄÁϼ°²¿×é¼þ¿â´æÓÐЧÐÔ¼°ÊýֵģÄâ¼¼ÊõÑо¿¹¤×÷¡£ÔøÏȺó»ñ¹ú¼Ò¿Æ¼¼½ø²½¶þµÈ½±Ò»Ïî¡¢¾ü¶Ó¼¶ ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-27Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-ÀîÃ÷
µ¼Ê¦ÐÕÃû£ºÀîÃ÷ÐÔ±ð£ºÈËÆøÖ¸Êý£º114ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£ºÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£º¸öÈ˼òÊö:2008Äê»ñ¹ú¼ÒÁôѧ»ù½ð×ÊÖú£¬ÔÚ½£ÇÅ´óѧ¿¨ÎĵÏÐíʵÑéÊÒ½øÐС°µ¥¾§¹èÔÚ½Ó´¥ÔغÉϵĽṹÏà±ä¡±µÄÑо¿¹¤×÷¡£Íê³ÉÒ»Ïî×ÔÈ»¿ÆÑ§ÇàÄê»ù½ð£»ÁªºÏ²ÎÓëÒ»Ïî¹ú¼Ò×ÔÈ»¿ÆÑ§»ù½ðÖØµãÏîÄ¿¡£ ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-27Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-ºÎ±Ì
µ¼Ê¦ÐÕÃû£ººÎ±ÌÐÔ±ð£ºÈËÆøÖ¸Êý£º108ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£ºÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£ºÑо¿ÁìÓò£ºº¬ÄܲÄÁÏÊýֵģÄâÑо¿£»ÐÂÐÍÆð±¬Óëµã»ð¼¼ÊõÑо¿£»Õ¨Ò©¼°Ïà¹Ø²¿¼þ°²È«ÐÔÄÜÑо¿ÓëÆÀ¹À¡£Ñо¿ÁìÓò£ºº¬ÄܲÄÁÏÊýֵģÄâÑо¿£»ÐÂÐÍÆð±¬Óëµã»ð¼¼ÊõÑо¿£»Õ¨Ò©¼°Ïà¹Ø²¿¼þ°²È«ÐÔÄÜÑо¿ÓëÆÀ ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-27Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-µË½¨¹ú
µ¼Ê¦ÐÕÃû£ºµË½¨¹úÐÔ±ð£ºÈËÆøÖ¸Êý£º107ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£ºÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£º¸öÈ˼òÊö:ÏÖÖ÷Òª´ÓʾۺÏÎ﹦ÄÜ΢Çò£¬¸´ºÏ²ÄÁÏ£¬ÄÉÃײÄÁϵÄÖÆ±¸¼°ÐÔÄÜÑо¿£¬ÔÚ¹úÄÚÍâÆÚ¿¯·¢±íÂÛÎÄ70ÓàÆª¡£ÉêÇë8ÏîÖйúרÀû£¨ÒÑÊÚȨ3Ï£¬1ÏîÃÀ¹úרÀû£¨ÒÑÊÚȨ3Ï£¬2Ïî¼¼Êõ³É¹û ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-27Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-Äô¸£µÂ
µ¼Ê¦ÐÕÃû£ºÄô¸£µÂÐÔ±ð£ºÈËÆøÖ¸Êý£º107ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£º²©µ¼ÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£º¸öÈ˼òÊö:³Ðµ£¹ú·À973¿ÎÌâÒ»Ïî¡¢²¿¼¶Öصã¿ÎÌâ¶àÏ³Ðµ£×ÔÈ»¿ÆÑ§»ù½ðÒ»ÏÁªºÏ²ÎÓë¶àÏî¹ú¼Ò×ÔÈ»¿ÆÑ§»ù½ðÑо¿¡£ÏÖÖ÷Òª´ÓÊÂÄÉÃ׺¬ÄܲÄÁÏ¡¢ÄÉÃׯ÷¼þÉè¼Æ¡¢º¬ÄܲÄÁϽṹÓëÐÔÄܵÈÑо¿ ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-27Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-Àî½ðɽ
µ¼Ê¦ÐÕÃû£ºÀî½ðɽÐÔ±ð£ºÈËÆøÖ¸Êý£º86ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£º²©µ¼ÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£º¸öÈ˼òÊö:½Î÷ÍòÄêÏØÈË,1985µ½1992ÄêÔÚËÄ´¨´óѧ»¯Ñ§ÏµÍê³É±¾¿ÆºÍ˶ʿ½×¶ÎµÄѧϰ£¬Í¬Äê·ÖÅäµ½»¯¹¤²ÄÁÏÑо¿Ëù¹¤×÷¡£2000»ñÄϾ©Àí¹¤´óѧ²ÄÁÏѧöλÔÓéÀֵǼÈë¿ÚÏÂÔØ²©Ê¿Ñ§Î»£¬2000-20 ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-27Öйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)öλÔÓéÀÖ¹Ù·½appÏÂÔØÑо¿Éúµ¼Ê¦¼ò½é-ÁúÐÂÆ½
µ¼Ê¦ÐÕÃû£ºÁúÐÂÆ½ÐÔ±ð£ºÈËÆøÖ¸Êý£º77ËùÊôԺУ£ºÖйú¹¤³ÌÎïÀíÑо¿Ôº(»¯¹¤²ÄÁÏÑо¿Ëù)ËùÊôԺϵ£ºÖ°³Æ£ºÑо¿Ô±µ¼Ê¦ÀàÐÍ£º²©µ¼ÕÐÉúöλÔÓéÀֵǼÈë¿ÚÏÂÔØ£º¸öÈ˼òÊö:Öйú¹¤³ÌÎïÀíÑо¿ÔºÑо¿Éú²¿²©Ê¿Éúµ¼Ê¦£»±±¾©Àí¹¤´óѧ¼æÖ°²©Ê¿Éúµ¼Ê¦¡£ÏíÊÜÕþ¸®ÌØÊâ½òÌù¡£ÈÙ»ñ¡°Öйú¿ÆÐÇóÊǽܳöÇàÄêʵÓù¤³Ì½±¡±¡¢¡°È«¹úÊ®´ó½Ü³öÇàÄꡱµÈ¶àÏîÈÙÓþ³ÆºÅ¡£2 ...µ¼Ê¦ÐÅÏ¢ ±¾Õ¾Ð¡±à FreeöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-272019ÖйúÈËÃñ´óѧÓïÑÔѧ¼°Ó¦ÓÃÓïÑÔѧ×ÜÅÅÃûµÚÒ»¾ÑéÌû
Ò»¡¢¸öÈËÇé¿ö ±¨¿¼Ñ§Ð£¼°öλÔÓéÀֵǼÈë¿ÚÏÂÔØ£ºÖйúÈËÃñ´óѧ£¬ÓïÑÔѧ¼°Ó¦ÓÃÓïÑÔѧ ³õÊÔÅÅÃûµÚ1£¬×Ü·Ö397·Ö£¨ÕþÖÎ68£¬Ó¢ÓïÒ»78£¬ººÓïÑÔ»ù´¡115£¬ÓïÑÔѧ»ù´¡136£© ¸´ÊÔÅÅÃûµÚ2£¬×Ü·Ö290£¨Âú·Ö350£© ×ÛºÏÅÅÃûµÚ1£¬×ܳɼ¨80.78£¨Äâ¼ȡ£© ¶þ¡¢±¸¿¼¾Ñé ¡¾ÕþÖΡ¿ 1. öλÔÓéÀÖ¹Ù·½appÏÂÔØ£º £¨1£©Ð¤ÐãÈÙ£º¾«½²¾«Á·¡¢1000Ìâ¡¢½²ÕæÌ⡢Ф°Ë¡¢Ð¤ ...öλÔÓéÀֵǼÈë¿ÚÏÂÔØ¿ÎöλÔÓéÀÖ¹Ù·½appÏÂÔØ¾Ñé °×ÌÒÆßÆß öλÔÓéÀÖ¹Ù·½appÏÂÔØ¼ÓÓÍÕ¾ 2019-05-262020ÄêöλÔÓéÀÖ¹Ù·½appÏÂÔØ:½ðÈÚר˶ԺУÅÅÃûTOP100
¡¡¡¡½ðÈÚר˶ÊDZ¨¿¼ÈÈÃÅ£¬Á˽â½ðÈÚר˶ԺУÅÅÃûÇé¿ö£¬´ó¼Ò²ÅÄܸüºÃµØÔñУ¡£±¾ÎÄ·ÖÏí½ðÈÚר˶ԺУÅÅÃûTOP100£¬´ó¼Ò¿´¿´¡¡¡¡1 A++ ÖйúÈËÃñ´óѧ¡¡¡¡2 A++ ±±¾©´óѧ¡¡¡¡3 A++ ¸´µ©´óѧ¡¡¡¡4 A++ ÏÃÃÅ´óѧ¡¡¡¡5 A+ ÄÏ¿ª´óѧ¡¡¡¡6 A+ ÉϺ£²Æ¾´óѧ¡¡¡¡7 A+ Õã½´óѧ¡¡¡¡8 A ÄϾ©´óѧ¡¡¡¡9 A Î人´óѧ¡¡¡¡10 A ÖÐÄϲƾÕþ·¨´óѧ¡¡ ...öλÔÓéÀÖ¹Ù·½appÏÂÔØ±¨¿¼ÐÅÏ¢ ±¾Õ¾Ð¡±à Ãâ·ÑöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-05-26Î÷°²½»Í¨´óѧÁ÷ÌåÁ¦Ñ§¿ÎºóϰÌâ´ð°¸
Ò»¡¢ Ñ¡ÔñÌâ(ÂÔ) ¶þ¡¢ ÅжÏÌâ(ÂÔ) Èý¡¢ ¼ò´ðÌâ 1.µÈÑ¹ÃæÊÇË®Æ½ÃæµÄÌõ¼þÊÇʲô£¿ :¢ÙÁ¬Ðø½éÖÊ ¢Ú ͬһ½éÖÊ ¢Û µ¥Ò»ÖØÁ¦×÷ÓÃÏÂ. 2. ͬһÈÝÆ÷ÖÐ×°Á½ÖÖÒºÌ壬ÇÒ £¬ÔÚÈÝÆ÷²à±Ú×°ÁËÁ½¸ù²âѹ¹Ü¡£ÊÔÎÊ£ºÍ¼ÖÐËù±êÃ÷µÄ²âѹ¹ÜÖÐÒºÃæÎ»ÖöÔÂð£¿ÎªÊ²Ã´£¿ ½â£º²»¶Ô£¬£¨ÓÒ²âѹ¹ÜÒºÃæÒªµÍһЩ£¬´ÓµãѹǿµÄ´óС·ÖÎö£© 3. ͼÖÐ ...öλÔÓéÀֵǼÈë¿ÚÏÂÔØ¿ÎöλÔÓéÀÖ¹Ù·½appÏÂÔØöλÔÓéÀÖ¹Ù·½appÏÂÔØ ±¾Õ¾Ð¡±à Ãâ·ÑöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-04-14Î÷°²½¨Öþ¿Æ¼¼´óѧ½á¹¹Á¦Ñ§Ñо¿ÉúÈëѧöλÔÓéÀֵǼÈë¿ÚÏÂÔØÑ§Ï°±Ê¼Ç(ͼÎÄ)
.. ...öλÔÓéÀֵǼÈë¿ÚÏÂÔØ¿ÎöλÔÓéÀÖ¹Ù·½appÏÂÔØöλÔÓéÀÖ¹Ù·½appÏÂÔØ ±¾Õ¾Ð¡±à Ãâ·ÑöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-04-14Î人Àí¹¤´óѧ²ÄÁÏѧԺÑо¿Éú¸´ÊÔÊÔÌâºÍÏà¹ØÃæÊÔ×¢ÒâÊÂÏî
.. ...öλÔÓéÀֵǼÈë¿ÚÏÂÔØ¿ÎöλÔÓéÀÖ¹Ù·½appÏÂÔØöλÔÓéÀÖ¹Ù·½appÏÂÔØ ±¾Õ¾Ð¡±à Ãâ·ÑöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-04-13Î人Àí¹¤´óѧ²ÄÁÏѧԺöλÔÓéÀÖ¹Ù·½appÏÂÔØ¸´ÊÔöλÔÓéÀÖ¹Ù·½appÏÂÔØ
Ò»¡¢Listening Comprehension (20 Points) ´ð°¸Ö±½ÓдÔÚÊÔ¾íÉÏ Section A Directions£ºIn this sectioin you will hear 5 short conversations.At the end of each conversation, a question will be asked about what was said. Each conversations and questions will be spoken only once. After each question ther ...öλÔÓéÀֵǼÈë¿ÚÏÂÔØ¿ÎöλÔÓéÀÖ¹Ù·½appÏÂÔØöλÔÓéÀÖ¹Ù·½appÏÂÔØ ±¾Õ¾Ð¡±à Ãâ·ÑöλÔÓéÀÖ¹Ù·½appÏÂÔØÍø 2019-04-13
